|
Affiliation |
Institute for Multidisciplinary Sciences |
|
Job Title |
Assistant Professor |
SANO Marie
|
|
Degree 【 display / non-display 】
-
Doctor of Engineering - Chiba University
Campus Career 【 display / non-display 】
-
2024.6
Duty Yokohama National UniversityInstitute for Multidisciplinary Sciences Assistant Professor
-
2023.7-2024.5
Duty Yokohama National UniversityFaculty of Engineering Division of Systems Research Assistant Professor
Papers 【 display / non-display 】
-
SiCN膜の膜質がハイブリッドボンディングに及ぼす影響
中田涼平, 石谷伸治, 持田篤範, 櫻井大輔, 佐野麻理恵, 井上史大
第40回エレクトロニクス実装学会春季講演大会論文集 2026.3
Language:Japanese Publishing type:Research paper (scientific journal) Single Work
-
Statistical Evaluation of Bond Strength Variation in Hybrid Bonding Interfaces
Daiki Kobayashi, Shunsuke Teranishi, Yuki Yoshihara, Marie Sano, Fumihiro Inoue
2025 IEEE 27th Electronics Packaging Technology Conference (EPTC) 2026.2 [Reviewed]
Language:English Publishing type:Research paper (international conference proceedings) Joint Work
-
Measurement Methods of Within-Wafer Bond Strength Uniformity for Hybrid Bonding
KOBAYASHI Daiki, FUSE Junya, KONDO Yusuke, YOSHIHARA Yuki, SANO Marie, INOUE Fumihiro
Journal of Smart Processing 15 ( 1 ) 31 - 35 2026.1
Language:Japanese Publishing type:Research paper (scientific journal) Publisher:Smart Processing Society for Materials, Environment & Energy (High Temperature Society of Japan) Joint Work
-
Void-Free, Low-temperature Direct Bonding of Si–Si for μLHP Integration in 3D ICs
Dianping Jiang, Marie Sano, Fumihiro Inoue, Masaaki Hashimoto, Hosei Nagano, Munehiro Tada
2025 International Conference on Solid State Devices and Materials 2025.9 [Reviewed]
Language:English Publishing type:Research paper (international conference proceedings) Single Work
-
Within-Wafer and Within-Die Uniformity of Bond Strength for Hybrid Bonding
Daiki Kobayashi, Junya Fuse, Yusuke Kondo, Yuki Yoshihara, Marie Sano, Fumihiro Inoue
2025 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) 2025.5 [Reviewed]
Language:English Publishing type:Research paper (international conference proceedings) Single Work
Presentations 【 display / non-display 】
-
Impact of Long-term Stress and Measurement Environment on Bonding Strength
Proceedings of Microelectronics Symposium 2023.9 The Japan Institute of Electronics Packaging
Event date: 2023
Language:Japanese Presentation type:Oral presentation (general)